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Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM

Published online by Cambridge University Press:  08 April 2017

V-D Hodoroaba ,
T Salge ,
R Terborg  and
V Rackwitz
V-D Hodoroaba
Affiliation:
BAM Federal Institute for Materials Research & Testing
T Salge
Affiliation:
Bruker Nano
R Terborg
Affiliation:
Bruker Nano
V Rackwitz
Affiliation:
BAM Federal Institute for Materials Research & Testing

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 600 - 601
Copyright
Copyright © Microscopy Society of America 2011