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Advantages of Using Low Voltage for Elemental Mapping by Energy Dispersive X-Ray Spectroscopy in Pharmaceutical Systems

Published online by Cambridge University Press:  23 September 2015

Joseph Neilly  and
John Roth
Joseph Neilly
Affiliation:
AbbVie Inc.NCE Analytical Chemistry, North Chicago, IL 60054-6202
John Roth
Affiliation:
AbbVie Inc.NCE Analytical Chemistry, North Chicago, IL 60054-6202

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 551 - 552
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Goldstein, J, et al., in Scanning Electron Microscopy and X-Ray Microanalysis, 3rd ed, Plenum New York, 2003). pp 207–209.Google Scholar
[2] Nylese, T, Anderhalt, R. & Gorcea, V., Microsc. Microanal 19(Suppl 2) (2013). pp. 272–273.CrossRefGoogle Scholar