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Analysis of Defects in HgCdTe and CdTe Epilayers on Si by Dual-Beam FIB

Published online by Cambridge University Press:  31 July 2006

T Lee ,
J Huang ,
DK Cha ,
RN Jacobs ,
JH Dinan  and
MJ Kim
T Lee
Affiliation:
University of Texas at Dallas
J Huang
Affiliation:
University of Texas at Dallas
DK Cha
Affiliation:
University of Texas at Dallas
RN Jacobs
Affiliation:
U.S. ARMY
JH Dinan
Affiliation:
U.S. ARMY
MJ Kim
Affiliation:
University of Texas at Dallas

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1274 - 1275
Copyright
© 2006 Microscopy Society of America