Hostname: page-component-848d4c4894-75dct Total loading time: 0 Render date: 2024-05-07T21:25:26.896Z Has data issue: false hasContentIssue false
  • English
  • Français

Analytical Electron Microscopy of Thin Film / Ionic Liquid Interfaces Prepared using a Focused Ion Beam

Published online by Cambridge University Press:  09 October 2013

J.D. Sloppy ,
A.C. Lang ,
R. Devlin ,
H. Ghassemi ,
R.J. Sichel-Tissot ,
S. May ,
J.C. Idrobo  and
M.L. Taheri
J.D. Sloppy
Affiliation:
A.C. Lang
Affiliation:
R. Devlin
Affiliation:
H. Ghassemi
Affiliation:
R.J. Sichel-Tissot
Affiliation:
S. May
Affiliation:
J.C. Idrobo
Affiliation:
M.L. Taheri
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1636 - 1637
Copyright
Copyright © Microscopy Society of America 2013