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Annular Bright-Field Electron Microscopy Tracking Solid-State Chemical Reaction

Published online by Cambridge University Press:  23 September 2015

Peng Gao
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan
Eita Tochigi
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan
Akihito Kumamoto
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Gao, P., et al, Nature Communications 4 (2013) 2791.Google Scholar
[2] Ishikawa, R., et al, Physical Review Letters 113 (2014) 155501.CrossRefGoogle Scholar
[3] Findlay, S., et al, Applied Physics Express 3 (2010) 116603.CrossRefGoogle Scholar
[4] The authors gratefully acknowledge the financial support through a Grant-in-Aid for Scientific Research on Innovative Areas "Nano Informatics" (Grant No. 25106003) from Japan Society for the Promotion of Science (JSPS), and "Nanotechnology Platform" (Project No. 12024046) from the Ministry of Education, Culture, Sports, Science and Technology in Japan (MEXT)..Google Scholar