Hostname: page-component-76fb5796d-2lccl Total loading time: 0 Render date: 2024-04-29T17:17:07.811Z Has data issue: false hasContentIssue false

The Application of Cryogenic Focused Ion Beam Scanning Electron Microscopy to Hydrogel Characterization.

Published online by Cambridge University Press:  25 July 2016

Christopher Parmenter
Affiliation:
Nottingham Nanoscale and Microscale Research Centre, University of Nottingham, Nottingham, UK
Abdulraman Baki
Affiliation:
Wolfson Centre for Stem Cells, Tissue Engineering and Modelling (STEM), School of Pharmacy, University of Nottingham, Nottingham, UK
Kevin M Shakesheff
Affiliation:
Wolfson Centre for Stem Cells, Tissue Engineering and Modelling (STEM), School of Pharmacy, University of Nottingham, Nottingham, UK

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Al-Abboodi, A, et al, Biotech and Bioengineering 110 (2013). p 328.Google Scholar
[2] Marko, M, et al., J Microsc 222 (2006). p 42.Google Scholar