Hostname: page-component-848d4c4894-wg55d Total loading time: 0 Render date: 2024-05-28T18:50:12.749Z Has data issue: false hasContentIssue false
  • English
  • Français

Application of Focused Ion Beam Microscopy to Astromaterials

Published online by Cambridge University Press:  05 August 2007

N Teslich ,
G Graham ,
JP Bradley ,
Z Dai ,
H Ishii ,
A Kearsley  and
L Keller
N Teslich
Affiliation:
Lawrence Livermore National Laboratory,USA
G Graham
Affiliation:
Lawrence Livermore National Laboratory,USA
JP Bradley
Affiliation:
Lawrence Livermore National Laboratory,USA
Z Dai
Affiliation:
Lawrence Livermore National Laboratory,USA
H Ishii
Affiliation:
Lawrence Livermore National Laboratory,USA
A Kearsley
Affiliation:
The Natural History Museum,UK
L Keller
Affiliation:
NASA Johnson Space Center,USA
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1534 - 1535
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)