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Application of the Projective Standard Deviation to STEM Imaging and Analysis

Published online by Cambridge University Press:  27 August 2014

Everett D. Grimley ,
Xiahan Sang  and
James M. LeBeau
Everett D. Grimley
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC
Xiahan Sang
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 118 - 119
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Sang, XandLeBeau, JM Ultramicroscopy 138 (2014), p. 28.Google Scholar
[2] The authors acknowledge the use of the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation. The authors also acknowledge use of the High Performance Computing (HPC) services at North Carolina State University.Google Scholar