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Applications, Technical Challenges, and Recent Implementation of a UHV/Cryogenic Specimen Transfer System for Atom Probe Tomography

Published online by Cambridge University Press:  04 August 2017

Robert M. Ulfig
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Thomas F. Kelly
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Ty J. Prosa
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Jeffrey Shepard
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Baptiste Gault
Affiliation:
MPIE Max-Planck-StraBe 1, DusseldorfGermany.
Leigh Stephenson
Affiliation:
MPIE Max-Planck-StraBe 1, DusseldorfGermany.
D. von Gunten
Affiliation:
Ferrovac GMBH, Thurgauerstrasse 72, Zurich, Switzerland.
U. Maier
Affiliation:
Ferrovac GMBH, Thurgauerstrasse 72, Zurich, Switzerland.
Sigrun A. Koster
Affiliation:
Ferrovac GMBH, Thurgauerstrasse 72, Zurich, Switzerland.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Larson, D.J., et al Local Electrode Atom Probe Tomography Springer New York 2013.Google Scholar
[2] Gerstly, S. & Wepf, R. Microsc. Microanal 21(Suppl 3 2015.Google Scholar
[3] Perea, D. E., et al, Sci. Rep 6 2016.Google Scholar