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Associative Multiple-Label Image Analysis Method for Synapse Identification in Neuronal Cultures: Application to Comparative Analysis of Synapse Formation Efficiency & Distribution on Smooth and Topographically Modified Surfaces

Published online by Cambridge University Press:  01 August 2005

H Narasimha-Iyer
Affiliation:
Rensselaer Polytechnic Institute, Troy, New York
N M Dowell-Mesfin
Affiliation:
Wadsworth Center, Albany, New York
M–A Abdul-Karim
Affiliation:
Rensselaer Polytechnic Institute, Troy, New York
B Roysam
Affiliation:
Rensselaer Polytechnic Institute, Troy, New York
J Turner
Affiliation:
Wadsworth Center, Albany, New York
W Shain
Affiliation:
Wadsworth Center, Albany, New York

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Copyright
© 2005 Microscopy Society of America