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Atom Detection in Time-resolved TEM Image Series: Application of Computer Vision Techniques to Noise-degraded Frames

Published online by Cambridge University Press:  30 July 2021

Ramon Manzorro ,
Yuchen Xu ,
Joshua Vincent ,
Roberto Rivera ,
David Matteson  and
Peter Crozier
Ramon Manzorro
Affiliation:
Arizona State University, United States
Yuchen Xu
Affiliation:
Cornell University, United States
Joshua Vincent
Affiliation:
Arizona State University, United States
Roberto Rivera
Affiliation:
University of Puerto Rico-Mayaguez, United States
David Matteson
Affiliation:
Cornell University, United States
Peter Crozier
Affiliation:
Arizona State University, Tempe, Arizona, United States

Abstract

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Type
New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2224 - 2225
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Levin, B. D. A., et al. Ultramicroscopy, 2019. 213, 112978.Google Scholar
Lindeberg, T., et al. Image Vision Comput., 1997. 15, p. 415-434.CrossRefGoogle Scholar
Manzorro, R., et al. , manuscript in preparation.Google Scholar
We gratefully acknowledge support of NSF grant CBET-1604971, NRT-1922658, CCF-1934985, OAC-1940097, OAC-1940124 and OAC-1940276, and the facilities at ASU's John M. Cowley Center for High Resolution Electron Microscopy.Google Scholar