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Atomic Resolution Distortion Analysis of Yttrium-Doped Barium Zirconate

Published online by Cambridge University Press:  25 July 2016

Jilai Ding ,
Xiahan Sang ,
Janakiraman Balachandran ,
Nazanin Bassiri-Gharb ,
Panchapakesan Ganesh  and
Raymond R. Unocic
Jilai Ding
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, USA
Xiahan Sang
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, USA
Janakiraman Balachandran
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, USA
Nazanin Bassiri-Gharb
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, USA G. W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, USA
Panchapakesan Ganesh
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, USA
Raymond R. Unocic
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 910 - 911
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Pergolesi, D., et al, Nature Materials 9 (2010). p. 846.Google Scholar
[2] Oikawa, I. & Takamura, H. Chemistry of Materials 27 (2015). p. 6660.Google Scholar
[3] Sang, X., et al, Applied Physics Letters 106 (2015). p. 061913.Google Scholar
[4] Sang, X., et al, Microscopy and Microanalysis 20 (2014). p. 1764.Google Scholar
[5] Dycus, H., et al, Microscopy and Microanalysis 21 (2015). p. 946.Google Scholar
[6] Research supported by ORNL’s Laboratory Directed Research and Development Program, which is managed by UT-Battelle LLC for the U.S. DOE. Electron microscopy was conducted as part of a user proposal at Oak Ridge National Laboratory’s Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy Office of Science User Facility.Google Scholar