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Atomic Resolution Imaging of Dislocations in AlGaN and the Efficiency of UV LEDs

  • Colin J. Humphreys (a1) (a2), Fabien C-P. Massabuau (a1), Sneha L. Rhode (a3), Matthew K. Horton (a4), Thomas J. O’Hanlon (a1), Andras Kovacs (a5), Marcin S. Zielinski (a6), Menno J. Kappers (a1), Rafal E. Dunin-Borkowski (a5) and Rachel A. Oliver (a1)...
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Abstract

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References

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[1] Hashimoto, H, et al Japanese. J. Appl. Phys. 10 1971 1115.
[2] Hashimoto, H, et al, J. Phys. Soc. Japan 42 1977 1073.
[3] Hashimoto, H Uyeda, R Acta Cryst 10 1957 143.
[4] Narukawa, Y, et al, J. Phys. D: Appl. Phys 43 2010 354002.
[5] Kneissl, M Rass, J III-Nitride Ultraviolet Emitters 2016 Springer Switzerland.
[6] Oliver, R A, et al, J. Phys. D: Appl. Phys 43 2010 354003.
[7] Kneissl, M, et al, Semicond. Sci. Technol. 26 2011 014036.
[8] Hirsch, P B, et al, Philos. Mag. 93 2013 3925.
[9] Rhode, S, et al, J. Appl. Phys. 119 2016 105301.
[10] Sridhara Rao, D V, et al, XV International Workshop on Physics of Semiconductor Devices (IWPSD) 2009 264267.
[11] Massabuau, F C-P, et al, Nano Lett. 17 2017 48464852.
[12] Massabuau, F C-P, et al, J. Appl. Phys. 121 2017 013104.
[13] The authors acknowledge funding from the European Research Council, Grant 279361 (MACONS), the EU Grant 312483 (ESTEEM2), an ERC Starting Grant 307636 (SCOPE), the Lindemann Trust Fellowship and the EPSRC Grant EP/M010589/1 (Beyond Blue: New Horizons in Nitrides).
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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