Hostname: page-component-848d4c4894-p2v8j Total loading time: 0.001 Render date: 2024-05-14T17:49:13.248Z Has data issue: false hasContentIssue false

Atomic Structure of Interfaces: Link of Atomistic Calculations with High Resolution Electron Microscopy

Published online by Cambridge University Press:  02 July 2020

V. Vitek*
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Walnut St., PA19104
Get access

Extract

Since interfaces and grain boundaries affect critically many properties of materials, their atomic structure has been investigated very extensively using computer modeling. Most of these calculations have been made using semi-empirical central-force descriptions of atomic interactions, recently primarily the embedded-atom type many-body potentials. Owing to the approximate nature of such schemes, a connection with experimental observations that can validate the calculations is essential. The high resolution electron microscopy (HREM) is such experimental technique and it has, indeed, been frequently combined with calculations of interfacial structure and chemistry. In fact such a link is not only important for verification of the results of computer modeling but also crucial for meaningful interpretation of HREM observations. Hence, coupling the atomistic modeling with HREM is a synergistic procedure. It not only leads to better understanding of interfacial structures but may contribute significantly to the validation and assessment of limits of the schemes used for the description of atomic interactions.

Type
Spatially-Resolved Characterization of Interfaces in Materials
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Schmidt, C., Ernst, F., Finnis, M. W. and Vitek, V., Phys. Rev. Lett. V (1995) 2160.CrossRefGoogle Scholar
2.Siegl, R., Vitek, V., Inui, H., Kishida, K. and Yamaguchi, M., Philos. Mag. A 75 (1997) 1447.CrossRefGoogle Scholar
3.Vitek, V., Gutekunst, G., Mayer, J. and Rühle, M., Phil. Mag. A 71 (1995) 1219.CrossRefGoogle Scholar
4.Gutekunst, G., Mayer, J., Vitek, V. and Rühle, M., Phil. Mag. A 75 (1997) 1357.CrossRefGoogle Scholar
5.Wolf, U., Ernst, F., Muschik, T., Finnis, M. W. and Fischmeister, H. F., Phil. Mag. A 66 (1992) 991.CrossRefGoogle Scholar