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Atomic-Level Fabrication of Crystalline Oxides in STEM

Published online by Cambridge University Press:  23 September 2015

Q. He ,
S. Jesse ,
A.R. Lupini ,
D.N. Leonard ,
M.P. Oxley ,
O. Ovchinnikov ,
R. Unocic ,
A. Tselev ,
M. Fuentes-Cabrera  and
B. G. Sumpter
...Show all authors
Q. He
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
S. Jesse
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831
A.R. Lupini
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
D.N. Leonard
Affiliation:
Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
M.P. Oxley
Affiliation:
Dept of Physics and Astronomy, Vanderbilt University, Nashville, TN
O. Ovchinnikov
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Dept of Physics and Astronomy, Vanderbilt University, Nashville, TN
R. Unocic
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831
A. Tselev
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831
M. Fuentes-Cabrera
Affiliation:
The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
B. G. Sumpter
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
S.J. Pennycook
Affiliation:
Dept of Materials Science and Engineering, The University of Tennessee Knoxville, Knoxville, TN
S. V. Kalinin
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831
A.Y. Borisevich
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 939 - 940
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Eigler, D. M. & Schweizer, E. K., Nature (1990) 344, 524–526.Google Scholar
[2] Crommie, M. F., Lutz, C. P. & Eigler, D. M., Science (1993) 262, 218–220.Google Scholar
[3] Crommie, M. F., Lutz, C. P. & Eigler, D. M., Nature (1993) 363, 524–527.Google Scholar
[4] Eigler, D. M., Lutz, C. P. & Rudge, W. E., Nature (1991) 352, 600–603.CrossRefGoogle Scholar
[5] Heinrich, A. J., Lutz, C. P., Gupta, J. A. & Eigler, D. M., Science (2002) 298, 1381–1387.Google Scholar
[6] Moon, C. R., Lutz, C. P. & Manoharan, H. C., Nature Physics (2008) 4, 454–458.CrossRefGoogle Scholar
[7] Vieu, C., Carcenac, F., Pepin, A., Chen, Y., Mejias, M., Lebib, A., Manin-Ferlazzo, L., Couraud, L. & Launois, H., Applied Surface Science (2000) 164, 111–117.Google Scholar
[8] Jencic, aI., Bench, M. W., Robertson, I. M. & Kirk, M. A., Journal of Applied Physics (1995) 78, 974–982. bA. Meldrum, L. A. Boatner, R. C. Ewing, Journal of Materials Research 1997, 12, 1816-1827.Google Scholar
[9] Zhang, aY., Lian, J., Wang, C. M., Jiang, W., Ewing, R. C. & Weber, W. J., Physical Review B (2005) 72, 094112. bG. Zhu, G. A. Botton, in The 15th European Microscopy Congress, Manchester Central, United Kingdom, 2012.Google Scholar
[10] Zheng, K., Wang, C., Cheng, Y.-Q., Yue, Y., Han, X., Zhang, Z., Shan, Z., Mao, S. X., Ye, M., Yin, Y. & Ma, E., Nat Commun (2010) 1, 24.Google Scholar
[11] The research is sponsored by the Division of Materials Sciences and Engineering, Office of Basic Energy Sciences, U.S. Department of Energy. BGS and MF-C were supported by the Center for Nanophase Materials Sciences which is sponsored at Oak Ridge National Laboratory by the Office of Science, Basic Energy Sciences, U.S. Department of Energy. Calculations made use of resources at the Oak Ridge Leadership Computing Facility at the Oak Ridge National Laboratory, which is supported by the Office of Science of the U.S. Department of Energy under Contract DE-AC05-00OR22725..Google Scholar