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Atomic-Resolution Imaging in the Aberration-Corrected BNL JEM2200FS

Published online by Cambridge University Press:  31 July 2006

RF Klie  and
Y Zhu
RF Klie
Affiliation:
Brookhaven National Laboratory
Y Zhu
Affiliation:
Brookhaven National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1358 - 1359
Copyright
© 2006 Microscopy Society of America