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Atomic-Scale Studies of Complex Oxide Interfaces Using Aberration-Corrected Z-contrast Imaging and EELS

Published online by Cambridge University Press:  31 July 2006

RF Klie ,
MA Schofield ,
M Varela ,
SJ Pennycook ,
A Bleloch  and
Y Zhu
RF Klie
Affiliation:
Brookhaven National Laboratory
MA Schofield
Affiliation:
Brookhaven National Laboratory
M Varela
Affiliation:
Oak Ridge National Laboratory
SJ Pennycook
Affiliation:
Oak Ridge National Laboratory
A Bleloch
Affiliation:
SuperSTEM Laboratory,U.K.
Y Zhu
Affiliation:
Brookhaven National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Research Article
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 112 - 113
Copyright
© 2006 Microscopy Society of America

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