Hostname: page-component-76fb5796d-vfjqv Total loading time: 0 Render date: 2024-04-30T05:53:34.704Z Has data issue: false hasContentIssue false

Atom-Probe Tomography: Detection Efficiency and Resolution of Nanometer-Scale Precipitates in a Ti-5553 Alloy

Published online by Cambridge University Press:  25 July 2016

D. Isheim
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA Center for Atom-Probe Tomography (NUCAPT), Northwestern University, Evanston, IL, USA
J. Coakley
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, England
A. Radecka
Affiliation:
Department of Materials, Imperial College, South Kensington, London, England Rolls Royce Plc, Elton Road, Derby, England
D. Dye
Affiliation:
Department of Materials, Imperial College, South Kensington, London, England
T.J. Prosa
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Y. Chen
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
P.A.J. Bagot
Affiliation:
Department of Materials, University of Oxford, Oxford, England
D.N. Seidman
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA Center for Atom-Probe Tomography (NUCAPT), Northwestern University, Evanston, IL, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[I] Gault, B, et al, “Atom Probe Microscopy”. Springer, NewYork (2012).CrossRefGoogle Scholar
[2] Larson, DJ, et al, “Local Electrode Atom Probe Tomography: A User's Guide”. Springer (2014).Google Scholar
[3] Seidman, DN & Stiller, K MRS Bulletin 34 (2009). p. 717.CrossRefGoogle Scholar
[4] Ceguerra, AV, et al, Acta Crystallographica A68 (2012). p. 547.CrossRefGoogle Scholar
[5] Stephenson, LT, et al, Philosophical Magazine 93(8 (2013). p. 975.CrossRefGoogle Scholar
[6] Miller, MK, et al, Journal of Nuclear Materials 462 (2015). p. 428.CrossRefGoogle Scholar
[7] Prosa, TJ, et al, Proc. of SPIE 9173 (2014). p. 917307–1.Google Scholar
[8] Coakley, J, et al, Journal of Alloys and Compounds 646 (2015). p. 946.CrossRefGoogle Scholar
[9] Boyer, RR & Briggs, RD Journal of Materials Engineering and Performance 14 (2005). p. 681.CrossRefGoogle Scholar
[10] Thompson, K, et al, Ultramicroscopy 107 (2007). (p. 131.CrossRefGoogle Scholar
[11] The LEAP 4000X Si atom-probe tomograph at the NUCAPT facility of Northwestern Universitywas acquired and upgraded with equipment grants from the MRI program (NSF DMR-0420532) and theDURIP program of the Office of Naval Research (N00014-0400798, N00014-0610539, N00014-0910781). NUCAPT received support from the MRSEC program (NSF DMR-1121262) at the MaterialsResearch Center, SHyNE Resource (NSF NNCI-1542205), and the Initiative for Sustainability andEnergy (ISEN) at Northwestern University.Google Scholar