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Automated Qualitative Element Analysis of EDS Spectra with Considering Pile-Up Distortions in High Count-Rate Modes

Published online by Cambridge University Press:  08 April 2017

F Eggert ,
T Elam ,
R Anderhalt  and
J Nicolosi
F Eggert
Affiliation:
EDAX (Ametek)
T Elam
Affiliation:
EDAX (Ametek)
R Anderhalt
Affiliation:
EDAX (Ametek)
J Nicolosi
Affiliation:
EDAX (Ametek)

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1192 - 1193
Copyright
Copyright © Microscopy Society of America 2011