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Automation-Assisted Complementary Techniques for Multi-Spectroscopy TEM and STEM Spatially-Resolved Microanalysis

Published online by Cambridge University Press:  24 July 2003

A. Aitouchen ,
S. T. Kim  and
J. K. Weiss
A. Aitouchen
Affiliation:
Emispec, 2050 S. Cottonwood Dr., Tempe, AZ 85282
S. T. Kim
Affiliation:
Emispec, 2050 S. Cottonwood Dr., Tempe, AZ 85282
J. K. Weiss
Affiliation:
Emispec, 2050 S. Cottonwood Dr., Tempe, AZ 85282

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1002 - 1003
Copyright
Copyright © Microscopy Society of America 2003