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Average Atomic Number and Electron Backscattering in Compounds

Published online by Cambridge University Press:  05 August 2019

John Donovan ,
Jonathan Fellowes  and
Benjamin McMorran
John Donovan
Affiliation:
University of Oregon, CAMCOR, Eugene, Oregon, USA.
Jonathan Fellowes
Affiliation:
School of Earth and Environmental Sciences, Univ of Manchester, Manchester, UK.
Benjamin McMorran
Affiliation:
University of Oregon, Department of Physics, Eugene, Oregon, USA.

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2314 - 2315
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Donovan, J.J., Pingitore, N.E., Westphal, A., Microscopy & Microanalysis 9 (2003), p. 202.Google Scholar
[2]Llovet, X., Salvat, F., Microsc. Microanal. 23 (2017), p. 634.Google Scholar