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BadgerFilm: a versatile thin film analysis program for EPMA and more

Published online by Cambridge University Press:  30 July 2021

Aurélien Moy  and
John Fournelle
Aurélien Moy
Affiliation:
Department of Geoscience, University of Wisconsin-Madison, United States
John Fournelle
Affiliation:
Department of Geoscience, University of Wisconsin-Madison, United States

Abstract

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Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1658 - 1660
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Llovet, X., and Merlet, C. (2010) Electron Probe Microanalysis of Thin Films and Multilayers Using the Computer Program XFILM. Microscopy and Microanalysis, 16, 21–32.CrossRefGoogle ScholarPubMed
Moy, A., and Fournelle, J. (2021) ϕ(ρz) Distributions in Bulk and Thin Film Samples for EPMA. Part 1: A Modified ϕ(ρz) Distribution for Bulk Materials, Including Characteristic and Bremsstrahlung Fluorescence. Microscopy and Microanalysis, 1–18.Google Scholar
Moy, A., and Fournelle, J. (2021) ϕ(ρz) Distributions in Bulk and Thin-Film Samples for EPMA. Part 2: BadgerFilm: A New Thin-Film Analysis Program. Microscopy and Microanalysis, 1–13.Google Scholar
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Donovan, J.J., Kremser, D., Fournelle, J., and Goemann, K. (2020) Probe for EPMA v. 12.8.5 User's Guide and Reference, 430 p. Probe Software, Inc.Google Scholar
Support for this research came from the National Science Foundation: EAR-1337156 (JHF), EAR-1554269 (JHF) and EAR-1849386 (JHF).Google Scholar