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BadgerFilm: An Open Source Thin Film Analysis Program

Published online by Cambridge University Press:  30 July 2020

Aurélien Moy  and
John Fournelle
Aurélien Moy
Affiliation:
Department of Geoscience, University of Wisconsin-Madison, Madison, Wisconsin, United States
John Fournelle
Affiliation:
University of Wisconsin, Madison, Madison, Wisconsin, United States

Abstract

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Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 496 - 498
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Copyright
Copyright © Microscopy Society of America 2020

References

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Support for this research came from the National Science Foundation: EAR-1337156 (JHF), EAR-1554269 (JHF) and EAR-1849386 (JHF).Google Scholar