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Bulge Testing for Strength Metrics of Detector X-Ray Windows

Published online by Cambridge University Press:  23 September 2015

Joseph Rowley ,
Kendall Berry ,
Robert Davis ,
Richard R. Vanfleet ,
Sterling Cornaby ,
Mallorie Harker  and
Richard Creighton
Joseph Rowley
Affiliation:
Brigham Young University, Dept. of Physics and Astronomy, Provo, USA
Kendall Berry
Affiliation:
Brigham Young University, Dept. of Physics and Astronomy, Provo, USA
Robert Davis
Affiliation:
Brigham Young University, Dept. of Physics and Astronomy, Provo, USA
Richard R. Vanfleet
Affiliation:
Brigham Young University, Dept. of Physics and Astronomy, Provo, USA
Sterling Cornaby
Affiliation:
Moxtek Inc., Orem, USA
Mallorie Harker
Affiliation:
Moxtek Inc., Orem, USA
Richard Creighton
Affiliation:
Moxtek Inc., Orem, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2005 - 2006
Copyright
Copyright © Microscopy Society of America 2015 

References

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[3] Vlassak, J.J. & Nix, W.D. Journal of Materials Research, 7 (1992). pp 3242–3249.CrossRefGoogle Scholar
[4] Xiang, Y., Chen, X. & Vlassak, J.J., Journal of Materials Research 20 (2005). pp 2360–2370.CrossRefGoogle Scholar