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Cathodoluminescence Investigation of Electron Irradiation Damage in Insulators.

Published online by Cambridge University Press:  02 July 2020

M.A. Stevens Kalceff ,
M.R. Phillips  and
A.R. Moon
M.A. Stevens Kalceff
Affiliation:
Microstructural Analysis Unit, University of Technology, Sydney, PO 123, Broadway NSW 2007, Australiamarion@phys.uts.edu.au
M.R. Phillips
Affiliation:
Microstructural Analysis Unit, University of Technology, Sydney, PO 123, Broadway NSW 2007, Australiamarion@phys.uts.edu.au
A.R. Moon
Affiliation:
Microstructural Analysis Unit, University of Technology, Sydney, PO 123, Broadway NSW 2007, Australiamarion@phys.uts.edu.au
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Cathodoluminescence (CL) is the luminescent emission from a material which has been irradiated with electrons. Cathodoluminescence microanalysis (spectroscopy and microscopy) in an electron microscope complements the average defect structure information available from complementary techniques (e.g. Photoluminescence, Electron Spin Resonance spectroscopy). CL microanalysis enables both pre-existing and irradiation induced local variations in the bulk and surface defect structure to be characterized with high spatial (lateral and depth) resolution and sensitivity. This is possible as electron beam parameters such as the beam energy, may be varied to finely control the penetration depth of the incident electrons and hence the local volume of specimen probed.

Irradiation with charged and neutral energetic radiation produces defects in radiation sensitive materials. The energetic electron beam in an electron microscope may also induce defects in the specimen. Cazaux has characterized the electric field produced by electron irradiation of a insulator with a conductive surface coating

Type
Ceramics and Ceramic Composites
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 749 - 750
Copyright
Copyright © Microscopy Society of America 1997

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References

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