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Characterisation of Planar Defects in Ternary Layered Chalcogenides for Electronic Devices

Published online by Cambridge University Press:  22 July 2022

Tigran Simonian ,
Ahin Roy ,
Zdenek Sofer  and
Valeria Nicolosi
Tigran Simonian*
Affiliation:
Advanced Microscopy Centre, CRANN & AMBER, Grand Canal Quay, Trinity College Dublin, Ireland School of Chemistry, Trinity College Dublin, Ireland
Ahin Roy
Affiliation:
Advanced Microscopy Centre, CRANN & AMBER, Grand Canal Quay, Trinity College Dublin, Ireland School of Chemistry, Trinity College Dublin, Ireland
Zdenek Sofer
Affiliation:
Department of Inorganic Chemistry, University of Chemistry and Technology, Prague, Czechia
Valeria Nicolosi
Affiliation:
Advanced Microscopy Centre, CRANN & AMBER, Grand Canal Quay, Trinity College Dublin, Ireland School of Chemistry, Trinity College Dublin, Ireland
*
*Corresponding Author: simoniat@tcd.ie

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2392 - 2393
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Copyright
Copyright © Microscopy Society of America 2022

References

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