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Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  26 July 2009

S Duarte ,
A Avishai  and
A Sadan
S Duarte
Affiliation:
Case Western Reserve University
A Avishai
Affiliation:
Case Western Reserve University
A Sadan
Affiliation:
Case Western Reserve University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 368 - 369
Copyright
Copyright © Microscopy Society of America 2009