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Characterization of Rare Earth Element Ores with High Spatial Resolution Scanning Electron Microscopy

Published online by Cambridge University Press:  27 August 2014

C. Teng ,
H. Demers ,
N. Brodusch ,
K.E. Waters  and
R. Gauvin
C. Teng
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5
H. Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5
N. Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5
K.E. Waters
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5
R. Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 648 - 649
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Feng, Xie, et al., "A critical review on solvent extraction of rare earths from aqueous solutions." Minerals Engineering 56 (2014): 10-28.Google Scholar
[2] Crow, J. M. New Scientist, 2817 (2011)36-41.Google Scholar
[3] Demers, H., et al., "Characterisation of rare earth minerals with field emission scanning electron microscopy." Canadian Metallurgical Quarterly 52.3 (2013): 329-334.Google Scholar
[4] Kotula, P. G., Michael, J.R.andRohde, M. . "Results from two four-channel Si-drift detectors on an SEM: Conventional and annular geometries." Microscopy and Microanalysis 14.S2 (2008): 116-117.Google Scholar