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Characterization of Small Cu Grains Using the Conical Dark-Field Technique in the Transmission Electron Microscope

Published online by Cambridge University Press:  09 April 2017

R Hūbner ,
H-J Engelmann  and
E Zschech
R Hūbner
Affiliation:
Fraunhofer Institute Dresden, Germany
H-J Engelmann
Affiliation:
GLOBALFOUNDRIES Dresden, Germany
E Zschech
Affiliation:
Fraunhofer Institute Dresden, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1100 - 1101
Copyright
Copyright © Microscopy Society of America 2011