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Characterizing the influence of parent grain structures on the physical properties of additively manufactured Ti-64 alloys using EBSD

Published online by Cambridge University Press:  30 July 2021

Pat Trimby ,
Iain Anderson ,
Klaus Mehnert ,
John Porter  and
John Wheeler
Pat Trimby
Affiliation:
Oxford Instruments, High Wycombe, England, United Kingdom
Iain Anderson
Affiliation:
Oxford Instruments NanoAnalysis, United States
Klaus Mehnert
Affiliation:
ST Development GmbH, Paderborn, Germany
John Porter
Affiliation:
Castheon Inc., Thousand Oaks, California, United States
John Wheeler
Affiliation:
The University of Liverpool, Liverpool, England, United Kingdom

Abstract

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Type
Advanced Characterization of Components Fabricated by Additive Manufacturing
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2674 - 2676
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Liu, S. and Shin, Y.C., Materials and Design, 164 (2019) 107552CrossRefGoogle Scholar
Huang, C.-Y. et al. , Materialia, 9 (2020) 100554CrossRefGoogle Scholar
Wheeler, J. et al. , J. Microscopy, 233 (2009) pp. 482–494Google Scholar