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Chemical Characterization of Material Surfaces Using X-ray Photoelectron Spectroscopy (XPS): The Perfect Complement to Electron Microscopy Techniques

Published online by Cambridge University Press:  27 August 2014

BR Strohmeier ,
RG White ,
TS Nunney ,
P Mack  and
AE Wright
BR Strohmeier
Affiliation:
Thermo Fisher Scientific, 5225 Verona Road, Madison, WI, 53711 USA
RG White
Affiliation:
Thermo Fisher Scientific, Imberhorne Lane, East Grinstead, West Sussex, RH19 1UB UK
TS Nunney
Affiliation:
Thermo Fisher Scientific, Imberhorne Lane, East Grinstead, West Sussex, RH19 1UB UK
P Mack
Affiliation:
Thermo Fisher Scientific, Imberhorne Lane, East Grinstead, West Sussex, RH19 1UB UK
AE Wright
Affiliation:
Thermo Fisher Scientific, Imberhorne Lane, East Grinstead, West Sussex, RH19 1UB UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 2062 - 2063
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Briggs, D, Grant, JT “Surface Analysis by Auger and X-ray Photoelectron Spectroscopy,” (IM Publications, Chichester, West Sussex, UK) (2003.Google Scholar
[2] JF Moulder et al, “Handbook of X-ray Photoelectron Spectroscopy,” (Perkin Elmer Corporation, Eden Prairie, MN, USA) (1992, p. 107.Google Scholar
[3] The authors acknowledge Dr. KL Bunker, RJ Lee Group, Inc., for obtaining the STEM image and EDS map of the SWCNT sample shown in Figure 1.Google Scholar