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Comparative IR Microanalysis of Multilayer Samples Using IR Imaging and Mapping

Published online by Cambridge University Press:  24 July 2003

Thomas J. Tague Jr.
Thomas J. Tague Jr.*
Affiliation:
Bruker Optics, Inc., 19 Fortune Drive, Billerica, MA 01821

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1074 - 1075
Copyright
Copyright © Microscopy Society of America 2003