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Comparison of SDD/WDS/Micro-XRF Element Mapping Methods Using a Garnet Schist Example

Published online by Cambridge University Press:  01 August 2010

C Schwandt
C Schwandt
Affiliation:
McCrone Associates

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 914 - 915
Copyright
Copyright © Microscopy Society of America 2010