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Complementary SEM-EDS / FIB-SEM Sample Preparation Techniques for Atom Probe Tomography of nanophase-Fe0 in Apollo 16 Regolith Sample 61501,22

Published online by Cambridge University Press:  05 August 2019

P. Gopon ,
J.O. Douglas ,
J. Wade  and
M.P. Moody
P. Gopon*
Affiliation:
Dept. of Earth Science, University of Oxford, S. Parks Rd., Oxford OX1 3AN, UK
J.O. Douglas
Affiliation:
Dept. of Materials, University of Oxford, Parks Rd., Oxford OX1 3PH, UK
J. Wade
Affiliation:
Dept. of Earth Science, University of Oxford, S. Parks Rd., Oxford OX1 3AN, UK
M.P. Moody
Affiliation:
Dept. of Materials, University of Oxford, Parks Rd., Oxford OX1 3PH, UK
*
*Corresponding author: phillip.gopon@earth.ox.ac.uk

Abstract

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Type
New Frontiers in Atom Probe Tomography Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2544 - 2545
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Hapke, B., J. Geophys. Res., 106 (2001), no. 10, pp. 39–73.Google Scholar
[2]Gopon, P., et al. , Meteorit. Planet. Sci., 22 (2017) pp. 1–22.Google Scholar
[3]Thompson, K., et al. , Ultramicroscopy, 107 (2007) pp. 131–139.Google Scholar
[4]The authors acknowledge funding for this project from the Dept. of Materials, University of Oxford, and the Zeiss Crossbeam FIB/SEM used in this work was supported by the EPSRC through the Strategic Equipment Fund, Grant #EP/N010868/1.Google Scholar