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Contrast Transfer and Noise Minimization in Electron Ptychography

Published online by Cambridge University Press:  05 August 2019

Colum M. O'Leary ,
Gerardo T. Martinez ,
Emanuela Liberti ,
Martin J. Humphry ,
Angus I. Kirkland  and
Peter D. Nellist
Colum M. O'Leary
Affiliation:
University of Oxford, Department of Materials, Oxford, UK.
Gerardo T. Martinez
Affiliation:
University of Oxford, Department of Materials, Oxford, UK.
Emanuela Liberti
Affiliation:
University of Oxford, Department of Materials, Oxford, UK. electron Physical Sciences Imaging Centre (ePSIC), Diamond Light Source, UK.
Martin J. Humphry
Affiliation:
Phasefocus Ltd, Sheffield, UK.
Angus I. Kirkland
Affiliation:
University of Oxford, Department of Materials, Oxford, UK. electron Physical Sciences Imaging Centre (ePSIC), Diamond Light Source, UK.
Peter D. Nellist
Affiliation:
University of Oxford, Department of Materials, Oxford, UK.

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 64 - 65
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Yang, H et al. , Nature Communications 7 (2016), p. 12532.Google Scholar
[2]Yang, H, Pennycook, TJ and Nellist, PD, Ultramicroscopy 151 (2015), p. 232–239.Google Scholar
[3]Seki, T, Ikuhara, Y and Shibata, N, Ultramicroscopy 193 (2018), p. 118-125.Google Scholar
[4]The financial support of JEOL (UK) Ltd and the EPSRC is gratefully acknowledged.Google Scholar