Contribution of Cc-Correction to High-Resolution TEM at All Electron Energy Loss Regimes

J.-G. Wen; D.J. Miller; N.J. Zaluzec; J.M. Hiller; R.E. Cook

doi:10.1017/S1431927613004960

Contribution of Cc-Correction to High-Resolution TEM at All Electron Energy Loss Regimes

Published online by Cambridge University Press: 09 October 2013

J.-G. Wen ,

J.M. Hiller and

J.-G. Wen: Affiliation:
D.J. Miller: Affiliation:
N.J. Zaluzec: Affiliation:
J.M. Hiller: Affiliation:
R.E. Cook: Affiliation:

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Abstract

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 594 - 595

DOI: https://doi.org/10.1017/S1431927613004960 [Opens in a new window]

Article contents

Contribution of Cc-Correction to High-Resolution TEM at All Electron Energy Loss Regimes

Abstract

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