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Contribution of Cc-Correction to High-Resolution TEM at All Electron Energy Loss Regimes

Published online by Cambridge University Press:  09 October 2013

J.-G. Wen
Affiliation:
D.J. Miller
Affiliation:
N.J. Zaluzec
Affiliation:
J.M. Hiller
Affiliation:
R.E. Cook
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013