Hostname: page-component-848d4c4894-x24gv Total loading time: 0 Render date: 2024-05-16T21:42:55.636Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlation of Electron Diffraction between t-EBSD in the SEM, CBED in the TEM and ACOM using ASTAR in the TEM using GaN Nanowires

Published online by Cambridge University Press:  23 September 2015

Roy H. Geiss
Roy H. Geiss*
Affiliation:
Department of Chemistry, Colorado State University, Fort Collins, CO 80523-1872, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1249 - 1250
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Geiss, RH, et al, Microsc Microanal 16(S2, 2010). p 1742–1743.Google Scholar
[2] Trimby, PW, et al, Ultramicroscopy 120(0) (2012). p 16–24.Google Scholar
[3] Brodusch, N, et al, J Microscopy 250(1) (2013). p 1–14.CrossRefGoogle Scholar
[4] Suzuki, S., JOM 65(9) (2013). p 1254–1263.CrossRefGoogle Scholar
[5] de Kloe, R. EDAX blog, October 2014.Google Scholar
[6] Viladot, D, et al, J Microscopy 252(1) (2013). p 23–34.Google Scholar