Hostname: page-component-848d4c4894-nr4z6 Total loading time: 0 Render date: 2024-06-03T13:23:31.652Z Has data issue: false hasContentIssue false

Correlative characterization of the local deformation response and gage volume microstructure of pure Ni micro-samples via in-situ SEM testing and 3D EBSD

Published online by Cambridge University Press:  23 November 2012

P. Shade
Affiliation:
Air Force Research Laboratory, Wright-Patterson AFB, OH
M. Groeber
Affiliation:
Air Force Research Laboratory, Wright-Patterson AFB, OH
M. Uchic
Affiliation:
Air Force Research Laboratory, Wright-Patterson AFB, OH
R. Wheeler
Affiliation:
UES, Inc., Dayton, OH
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)