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Correlative Imaging of Stacking Faults using Atom Probe Tomography (APT) and Scanning Transmission Electron Microscopy (STEM)

Published online by Cambridge University Press:  27 August 2014

S. Dumpala ,
A. A. Oni ,
S. Padalkar ,
S.R. Broderick ,
J. M. LeBeau  and
K. Rajan
S. Dumpala
Affiliation:
Department of Materials Science and Engineering and Institute for Combinatorial Discovery, Iowa State University, 2220 Hoover Hall, Iowa State University, Ames, IA 50011, krajan@iastate.edu
A. A. Oni
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695
S. Padalkar
Affiliation:
Department of Materials Science and Engineering and Institute for Combinatorial Discovery, Iowa State University, 2220 Hoover Hall, Iowa State University, Ames, IA 50011, krajan@iastate.edu
S.R. Broderick
Affiliation:
Department of Materials Science and Engineering and Institute for Combinatorial Discovery, Iowa State University, 2220 Hoover Hall, Iowa State University, Ames, IA 50011, krajan@iastate.edu
J. M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695
K. Rajan
Affiliation:
Department of Materials Science and Engineering and Institute for Combinatorial Discovery, Iowa State University, 2220 Hoover Hall, Iowa State University, Ames, IA 50011, krajan@iastate.edu

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 996 - 997
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Blavette, D., et al, Microscopy and Microanalysis 13 (2007),06.Google Scholar
[2] The authors acknowledge support from Air Force Office of Scientific Research grants:FA9550-11-1-0158 and FA9550-12-0496; and NSF grant: ARI Program CMMI-09-389018.Google Scholar