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Depth Profiling Magnetic Structure Using Scanning Electron Microscopy with Polarization Analysis (SEMPA)

  • B McMorran (a1), D Pierce (a1) and J Unguris (a1)
  • DOI: http://dx.doi.org/10.1017/S1431927610060861
  • Published online: 01 July 2010
Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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