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Development of Spherical Aberration Corrected 300kV FETEM

Published online by Cambridge University Press:  05 August 2007

H Sawada ,
F Hosokawa ,
T Kaneyama ,
T Tomita ,
Y Kondo ,
T Tanaka ,
Y Oshima ,
Y Tanishiro ,
K Takayanagi  and
T Sannomiya
H Sawada
Affiliation:
CREST,Japan
F Hosokawa
Affiliation:
CREST,Japan
T Kaneyama
Affiliation:
CREST,Japan
T Tomita
Affiliation:
CREST,Japan
Y Kondo
Affiliation:
CREST,Japan
T Tanaka
Affiliation:
CREST,Japan
Y Oshima
Affiliation:
CREST,Japan
Y Tanishiro
Affiliation:
CREST,Japan
K Takayanagi
Affiliation:
CREST,Japan
T Sannomiya
Affiliation:
CREST,Japan
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 880 - 881
Copyright
© 2007 Microscopy Society of America

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