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Development of STEM for the HT7700 TEM and Optimization of Digital-Image Detectors Arrangement

Published online by Cambridge University Press:  23 November 2012

T. Hashimoto ,
S. Mamishin ,
A. Mouri ,
A. Watabe ,
M. Kondo ,
M. Okada ,
T. Wada ,
H. Mise ,
T. Oyagi  and
T. Yotsuji
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T. Hashimoto
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
S. Mamishin
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
A. Mouri
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
A. Watabe
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
M. Kondo
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
M. Okada
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
T. Wada
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
H. Mise
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
T. Oyagi
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
T. Yotsuji
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
Y. Nodera
Affiliation:
Software Systems Design Dept., Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
E. Nakazawa
Affiliation:
Global Application Center, Hitachi High-Technologies Co., Hitachinaka-shi, Ibaraki-ken, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1280 - 1281
Copyright
Copyright © Microscopy Society of America 2012

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