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Direct Observation of Defects in Hexagonal Boron Nitride Monolayers

Published online by Cambridge University Press:  27 August 2014

Peizhi Liu ,
Junjie Guo ,
Lei Liu ,
Wolfgang Windl ,
Gong Gu  and
Gerd Duscher
Peizhi Liu
Affiliation:
Department of Materials Science and Engineering, the University of Tennessee, Knoxville, TN 37996, United States
Junjie Guo
Affiliation:
Department of Materials Science and Engineering, the University of Tennessee, Knoxville, TN 37996, United States Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States
Lei Liu
Affiliation:
Department of Electrical Engineering and Computer Science, the University of Tennessee, Knoxville, TN 37996, United States
Wolfgang Windl
Affiliation:
Department of Materials Science and Engineering, Ohio State University, Columbus, OH 43210, United States
Gong Gu
Affiliation:
Department of Electrical Engineering and Computer Science, the University of Tennessee, Knoxville, TN 37996, United States
Gerd Duscher
Affiliation:
Department of Materials Science and Engineering, the University of Tennessee, Knoxville, TN 37996, United States Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1738 - 1739
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Liu, Y., Bhowmick, S., and Yakobson, B.I. Nano Letters 11 (2011). p. 3113-3116.Google Scholar
[2] Liu, Y., Zou, X., and Yakobson, B.I. ACS Nano 6 (2012). p. 7053-7058.Google Scholar
[3] Slotman, G.J., Fasolino, A. Journal of Physics: Condensed Matter 25 (2013) p. 045009.Google Scholar
[4] Krivanek, O.L., Chisholm, M.F., Nicolosi, V., et al. , Nature 464 (2010) p. 571-574.Google Scholar
[5] Mishra, R., Restrepo, O.D., Kumar, A., et al. , Journal of Materials Science 47 (2012): p. 7482-7497.Google Scholar
[6] We acknowledge the Joint Institute for Advanced Materials, and the Division of Materials Sciences and Engineering, Office of Basic Energy Sciences of the U.S. Department of Energy for the use of TEMand STEM.Google Scholar