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Dislocation Analysis of Thermal-Cycle-Annealed Mesa-Structured HgCdTe/HgTe/CdTe/ZnTe/Si (211)

Published online by Cambridge University Press:  25 July 2016

M. Vaghayenegar ,
S. Simingalam ,
Y. P. Chen  and
D. J. Smith
M. Vaghayenegar
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85287
S. Simingalam
Affiliation:
Army Research Laboratory, 2800 Power Mill Rd, Adelphi, MD 20783
Y. P. Chen
Affiliation:
Army Research Laboratory, 2800 Power Mill Rd, Adelphi, MD 20783
D. J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1584 - 1585
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Rogalski, A. Infrared. Phys. Techn 43 (2002) 187–210.CrossRefGoogle Scholar
[2] Rogalski, A. Infrared. Phys. Techn 50 (2007) 240–252.Google Scholar
[3] Jacobs, R. N., et al., J. Electron. Mater. 42 (2013) 3148–3155.Google Scholar
[4] Stoltz, A. J., et al., J. Electron. Mater. 40 (2011) 1785–1789.CrossRefGoogle Scholar
5] This work was supported by Army Research Office Grant #63749-EL. We gratefully acknowledge the use of facilities within the John M. Cowley Center for HREM at Arizona State University.Google Scholar