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SDD-EDS: Element Analysis of Nanostructures in TEM

Published online by Cambridge University Press:  23 November 2012

M. Falke ,
A. Kaeppel ,
S. Scheller ,
W. Hahn ,
R. Terborg ,
M. Rohde ,
Q. Ramasse ,
T.C. Lovejoy ,
N. Dellby  and
Z.S. Szilagyi
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M. Falke
Affiliation:
Bruker Nano GmbH, Berlin, Germany
A. Kaeppel
Affiliation:
Bruker Nano GmbH, Berlin, Germany
S. Scheller
Affiliation:
Bruker Nano GmbH, Berlin, Germany
W. Hahn
Affiliation:
Bruker Nano GmbH, Berlin, Germany
R. Terborg
Affiliation:
Bruker Nano GmbH, Berlin, Germany
M. Rohde
Affiliation:
Bruker Nano GmbH, Berlin, Germany
Q. Ramasse
Affiliation:
SuperSTEM Laboratory, Daresbury, United Kingdom
T.C. Lovejoy
Affiliation:
Nion, Kirkland, WA
N. Dellby
Affiliation:
Nion, Kirkland, WA
Z.S. Szilagyi
Affiliation:
Nion, Kirkland, WA
O.L. Krivanek
Affiliation:
Nion, Kirkland, WA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1058 - 1059
Copyright
Copyright © Microscopy Society of America 2012

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