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EDS of Lithium Materials from 0.5 to 30 keV

Published online by Cambridge University Press:  30 July 2021

Raynald Gauvin ,
Nicolas Brodusch ,
Frédéric Voisard ,
Nicolas Dumaresq ,
Karim Zaghib ,
Hendrix Demers  and
Michel Trudeau
Raynald Gauvin
Affiliation:
McGill University, Montreal, Quebec, Canada
Nicolas Brodusch
Affiliation:
McGill University, Montreal, Quebec, Canada
Frédéric Voisard
Affiliation:
McGill University, Montreal, Quebec, Canada
Nicolas Dumaresq
Affiliation:
McGill University, Montreal, Quebec, Canada
Karim Zaghib
Affiliation:
McGill University, Montreal, Quebec, Canada
Hendrix Demers
Affiliation:
Hydro-Québec, Quebec, Canada
Michel Trudeau
Affiliation:
Hydro-Québec, Quebec, Canada

Abstract

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Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1868 - 1869
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Hovington, P., Timoshevskii, V., Burgess, S., Demers, H., Statham, P., Gauvin, R., Zaghib, K. (2016), Scanning, 38, 6, pp. 571 – 578.Google Scholar
Brodusch, N., Demers, H., Gellé, A., Moores, A. and Gauvin, R. (2019), Ultramicroscopy, 203, pp.1-36.CrossRefGoogle Scholar
Gauvin, R. (2012), Microscopy & Microanalysis, 18, pp. 915–940.CrossRefGoogle Scholar