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Effect of Specimen Geometry on Quantitative EDS Analysis with Four-Quadrant Super-X Detectors

Published online by Cambridge University Press:  23 September 2015

W. Xu ,
J. H. Dycus ,
X. Sang ,
A. A. Oni  and
J. M. LeBeau
W. Xu
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA.
J. H. Dycus
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA.
X. Sang
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA.
A. A. Oni
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA.
J. M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1091 - 1092
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Schlossmacher, P., etal, Microscopy and Analysis (nanotechnology supplement) 24 (2010). p. 55.Google Scholar
[2] Allen, L.J., et al, MRS Bulletin 37 (2012). p. 47.Google Scholar
[3] Kothleitner, G., et al, Physical Review Letters 112 (2014). p. 085501.Google Scholar
[4] Lu, P., et al, Scientific Reports 4 (2014). p. 3945.CrossRefGoogle Scholar
[5] Watanabe, M., Microscopy 62 (2013). p. 217.Google Scholar
[6] Williams, D.B. & Goldstein, J.I. in Analytical Electron Microscopy 1981 (ed. R.H. Geiss, San Francisco Press, San Francisco, p. 39.Google Scholar
[7] This work is supported by the Air Force Office of Scientific Research (Grant: FA9550-14-1-0182). The authors also acknowledge the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation..Google Scholar