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Effects of Beam-Induced Carbon Deposition on Electron Energy-Loss Spectroscopy Analysis of Compositional Fluctuations in InGaN/GaN Quantum Well LEDs

Published online by Cambridge University Press:  05 August 2019

Sarah A. Goodman
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
Govindo J. Syaranamual
Affiliation:
Low Energy Electronic Systems, Singapore-MIT Alliance for Research and Technology, Singapore.
Jing Yang Chung
Affiliation:
Low Energy Electronic Systems, Singapore-MIT Alliance for Research and Technology, Singapore. Department of Materials Science and Engineering, National University of Singapore, Singapore.
Zhang Li
Affiliation:
Low Energy Electronic Systems, Singapore-MIT Alliance for Research and Technology, Singapore.
Akshay Singh
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
Dong Su
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA.
Kim Kisslinger
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA.
Rob Armitage
Affiliation:
Lumileds LLC, San Jose, CA, USA.
Isaac Wildeson
Affiliation:
Lumileds LLC, San Jose, CA, USA.
Parijat Deb
Affiliation:
Lumileds LLC, San Jose, CA, USA.
Eric Stach
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA.
Silvija Gradecak*
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
*
*Corresponding author: gradecak@mit.edu

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

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[6]The authors acknowledge funding from the Department of Energy, Office of Energy Efficiency and Renewable Energy (EERE) under Award Number DE-EE0007136.Google Scholar