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Electron Diffraction Based Tilt Angle Measurements in Electron Tomography

Published online by Cambridge University Press:  27 August 2014

Misa Hayashida ,
Marek Malac ,
Mike Bergen ,
Peng Li  and
Ray Egerton
Misa Hayashida
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Marek Malac
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Mike Bergen
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Peng Li
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Ray Egerton
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 806 - 807
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Yaguchi, T et. al. Ultramicroscopy 108 (2008) 1603.Google Scholar
[2] Hayashida, M et. al, (Submitted to Ultramicroscopy).Google Scholar
[3] Bergen, M et. al. Microscopy and Microanalysis 19 (S2), 1394-1395 (2013).Google Scholar