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Electron Imaging of Interfacial Oxygen by Aberration Corrected TEM, the Possibility and Scientific Opportunities

Published online by Cambridge University Press:  09 October 2013

W. Gao
Affiliation:
J. Wen
Affiliation:
D.J. Miller
Affiliation:
J.-M. Zuo
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013